Deringer-Ney Inc., a global leader in specialty precious metal alloys and precision components, announces the launch of Paliney®35, the latest innovation in high-performance alloys for semiconductor test applications.

Paliney®35 builds upon the proven success of Paliney®25 with a significant advancement in electrical conductivity while preserving the critical mechanical properties that have made Deringer-Ney the preferred choice for semiconductor test probe materials.

“Paliney®35 represents Deringer-Ney’s commitment to innovation and excellence in continuously improving specialty alloys in response to marketplace demands,” said Matthew Willson, Vice President of Sales and Marketing. “As our partners in the semiconductor industry push the boundaries of what’s possible in chip design, we’ve remained dedicated to developing materials that address today’s challenges while anticipating tomorrow’s requirements.”

Paliney®35 achieves an impressive 33% IACS (International Annealed Copper Standard), representing a substantial increase in conductivity compared to its predecessor. This enables semiconductor manufacturers to test increasingly miniaturized chip designs with reliable results and process more units simultaneously, without compromising accuracy. Further, it reduces failures caused by contact resistance issues. It also helps maintain optimal test conditions without damaging sensitive components.

“The development of Paliney®35 represents a significant metallurgical achievement,” said Dr. Patrick Bowen, Vice President of R&D, Quality and Regulatory at Deringer-Ney. “Increasing electrical conductivity while maintaining the strength and low contact resistance that made Paliney®25 successful required extensive research and engineering. The result is a material that addresses the semiconductor industry’s most critical test challenges.”

Today’s semiconductor testing requires probe materials that function as precision springs while delivering optimal electrical performance. Paliney®35 excels in three critical areas:

• Exceptional Strength – Maintains the robust spring properties needed for reliable pass/fail determination across thousands of test cycles
• Superior Electrical Conductivity – 33% IACS rating enables efficient power transfer without overheating sensitive components
• Noble Metal Properties – Resists oxidation and corrosion to ensure consistent and reliable performance

While primarily developed for semiconductor probe applications, Paliney®35’s combination of conductivity and hardness makes it suitable for other high-performance electrical contact scenarios where consistent electrical performance and wear resistance are critical.

For more information about Paliney®35 or to request technical specifications, visit www.deringerney.com or contact Deringer-Ney’s Application Engineer, Michael Bielecki ().

About Deringer-Ney

Deringer-Ney Inc. is a global market leader in the invention and application of custom precious metal alloys and precision machined, stamped, insert molded, and micro cold-formed components.  Applications include automotive position sensors, low current sliding electrical contacts, medium voltage powder metallurgy contacts, semiconductor test, military and aerospace components, and materials for interventional and implantable medical devices.  Manufacturing centers are located in Bloomfield CT, Marshall NC, and Nogales, Mexico.

> View Paliney 35 Details/Specs